Doctor of Engineering Physics

Reliability Assessment and Lifetime Modelling of p-GaN Gate AlGaN/GaN High-Electron-Mobility Transistors


PhD student Public defense
Name: Arno Stockman   Date: Wednesday 07/10/2020 om 17:00 
Address: ()
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  Location: vergaderzaal 2.3 August Vermeylen, Het Pand, tweede verdieping, Onderbergen 1, 9000 Gent
Contact FEA: info.ea@ugent.be   Language: Dutch

Curriculum
Master of Engineering Physics, UGent, 2016

Supervisor
Benoit Bakeroot
Jan Doutreloigne

Board of examiners
prof. Filip De Turck
Benoit Bakeroot (EA06)
Jan Doutreloigne (EA06)
Johan Lauwaert, Universiteit Gent, Faculteit Ingenieurswetenschappen en Architectuur, EA06 - Vakgroep Elektronica en Informatiesystemen, Technologiepark Zwijnaarde 126, 9052 Zwijnaarde
E: johan.lauwaert@ugent.be
Christophe Detavernier
Peter Moens
Oliver Hilt

Language of the thesis
English

Documents